• HIGH RESOLUTION 3D X-RAY MICROSCOPY AND COMPUTED TOMOGRAPHY

    The ZEISS XRADIA line is a tomography solution that characterizes the properties and behaviors of your materials non-destructively. Reveal details of microstructures in 3D, with the ability to develop/confirm models and visualize structural details. This system achieves high contrast and submicron resolution imaging, even for larger samples.
  • Year: 2020

    Manufacturer: GOM

    Model: METROTOM 6 Scout

    Serial #: 20-000120

  • HIGH-PRECISION REVERSE ENGINEERING

    ZEISS makes the path to a CAD model simple with the ability to easily create features for data preparation and surface reconstruction with a wide range of part types. ZEISS Reverse Engineering is versatile, with the capacity to use polygon meshes and point clouds from a number of different 3D measurement devices, including: tactile, optical, and CT measurement machines.
Go to Top