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FOR PRECISION MACHINED PARTS
This machine is a high-accuracy CNC coordinate measuring machine that guarantees a maximum permissible error of E0, MPE = (2.5+3L/1000)μm. With this CMM, measurement uncertainty remains within one-fifth of the dimension tolerance up to 30.2" (766mm). The higher accuracy specification gives it more than double the effective measuring range in terms of accuracy-guarantee capability. Combining high speed and high acceleration, this CMM reduces measuring time. As the number of measuring points increases, measuring costs per point are reduced. -
FOR HIGH-ACCURACY REFLECTOR MEASUREMENTS
Featuring the Leica Absolute Interferometer (AIFM), the Leica Absolute Tracker AT930 performs high speed dynamic measurement capabilities that set it apart from other trackers. This tracker is fast, accurate, and user friendly with automatic target location, real-time architecture, and the ability to instantly re-establish an interrupted beam. While the Leica Absolute Tracker AT930 is the 3D version of the AT960, it shares all the same features and functionality except for the variozoom 6DoF compatibility: making it the ideal solution for high-speed measurements in volumes of up to 160m (Ø). -
FOR LARGE MEASURING VOLUMES
The T-TRACK 20 is perfect for the optical tracking of parts with a larger volume. Combine the handheld T-POINT with this tracking system to quickly capture individual measuring positions. This T-TRACK 20 can be used for a wide range of applications including quality control & inspection, tool & mold making, and product development & design. -
MEASURING ANYWHERE WITH ENHANCED PRODUCTIVITY
The Absolute Tracker 500 (AT500) is the newest member of the Absolute Tracker line. With more extensive protection from outdoor elements, this tracker can be used from a mountain to the shop floor with its IP-54 rating and extended temperature working range. AT500 is ready to measure as soon as it's powered on as a result of its built-in controller and battery power. No leveling or reflector initialization required. -
ULTIMATE SOLUTION FOR PORTABLE MEASUREMENT ACCURACY
The 87 Series of the Hexagon Absolute Arm is the ultimate solution for portable high accuracy measurement . With various model sizes and accuracy levels, this arm ensures the right configuration is available for any measurement application. No matter the industry or application, this series of arms is perfect for the user who needs touch probe measurement and 3D laser scanning all rolled into one. -
RELIABLE, COMPACT CT TECHNOLOGY
Ease of use is the main priority of the ZEISS METROTOM 1. With just one scan, any user can effectively perform complex measurement and inspection tasks. With the small size of the METROTOM 1, this CT scanner can fit into your metrology lab and allows for inhouse measurements and inspections in one step. -
ADVANCED CT TECHNOLOGY FOR LARGE PARTS
Thanks to an extended measuring volume, the ZEISS METROTOM 1500 allows for the measurement of larger parts with a higher density. Because of its smaller voxel size, the new and improved 3K detector allows even the smallest details to be shown in higher resolution with a sharper volume. Scan time can be reduced by 75% with its various operation modes with its updated detector. -
INSPECTION WITH HIGH THROUGHPUT
The ZEISS METROTOM 800 CT systems are made for applications where many components need to be inspected quickly. The machine and software are customized to fit the inspection job. The ZEISS METROTOM 800 130kV, is small but powerful, taking on the measurement of plastic parts with high accuracy. The ZEISS METROTOM 800 225kV is for faster scans with denser parts. This system is custom built with options to fit what you need most. -
HIGH RESOLUTION 3D X-RAY MICROSCOPY AND COMPUTED TOMOGRAPHY
The ZEISS XRADIA line is a tomography solution that characterizes the properties and behaviors of your materials non-destructively. Reveal details of microstructures in 3D, with the ability to develop/confirm models and visualize structural details. This system achieves high contrast and submicron resolution imaging, even for larger samples.