HIGH RESOLUTION 3D X-RAY MICROSCOPY AND COMPUTED TOMOGRAPHY

The ZEISS XRADIA line is a tomography solution that characterizes the properties and behaviors of your materials non-destructively. Reveal details of microstructures in 3D, with the ability to develop/confirm models and visualize structural details. This system achieves high contrast and submicron resolution imaging, even for larger samples.

  • MICRO-STRUCTURE DETAILS IN 3D
  • HIGH CONTRAST AND SUBMICRON RESOLUTION

  • MICROSCOPY SOLUTIONS FOR ADDITIVE MANUFACTURING

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ZEISS INSPECT (Formerly GOM Inspect) Data

The Leading Software For ZEISS Measurement Systems

ZEISS INSPECT (formerly GOM Inspect) is the flagship software for simple or complex inspection tasks – from capturing the part to be inspected, mesh processing, CAD import, necessary GD&T calculations to trend analyses, digital assembly or proprietary inspections.

The Leading Software For ZEISS Measurement Systems

ZEISS INSPECT (formerly GOM Inspect) is the flagship software for simple or complex inspection tasks – from capturing the part to be inspected, mesh processing, CAD import, necessary GD&T calculations to trend analyses, digital assembly or proprietary inspections.